Vol 15 No 2 (2020): Journal of Integrated Circuits and Systems | Journal of Integrated Circuits and Systems

Michelly de Souza Renato Perez Ribas

JICS Editor-in-chief JICS Co-Editor

SBMicro2020 Special Section Guest Editors:

Durga Misra, New Jersey Institute of Technology – NJIT, United States
Michelly de Souza, Centro Universitário FEI, Brazil

Online ISSN: 1872-0234 (from 2017 on)

Printed ISSN: 1807-1953 (prior to 2017)

Published: 2020-08-01

Regular Papers

A Dual Port 8T SRAM Cell Using FinFET & CMOS Logic for Leakage Reduction and Enhanced Read & Write Stability

Chusen Duari, Shilpi Birla, Amit Kumar Singh

1-7
Analysis of the Negative-Bias-Temperature-Instability on Omega-Gate Silicon Nanowire SOI MOSFETs with Different Dimensions

Vanessa Cristina Pereira da Silva, Gilson Wirth, Joao Antonio Martino, Paula Ghedini Der Agopian

1-5

Special Section on SBMicro2020

List of Reviewers - SBMicro2020 Special Section

Michelly de Souza, Durga Misra

1-2
An Electric-Based Model for Coupling Traps Effect on Random Telegraph Noise

Thales Exenberger Becker, Pedro Augusto Böckmann Alves, Eduardo Pellin Moser, Gilson Inácio Wirth

1-4
Analysis of Current Mirrors with Asymmetric Self-Cascode Association of SOI MOSFETs through SPICE Simulations

Paulo Rodrigues da Silva, Michelly de Souza

1-5
Analysis of Mobility in Graded-Channel SOI Transistors Aiming at Circuit Simulation

Lucas Mota Barbosa da Silva, Bruna Cardoso Paz, Michelly de Souza

1-5
Design of a Biosensor Based on Interdigitated Microelectrodes with Detection Zone Controlled by an Integrated Microfluidic Channel

Alvaro Zazueta-Gambino, Claudia Reyes-Betanzo, José Herrera-Celis

1-5
Electrical Characterization of Positively Charged SiO Coatings for MOS Solar Cells

William Tsuyoshi Shiga, Stefanie Pereira Regis, Gabriel Oliveira Louzada, Marcos Norio Watanabe, Fábio Izumi, Verônica Christiano Abê, Ricardo Cardoso Rangel, Sebastião Gomes dos Santos Filho

1-5
Effect of Interface Traps on the RTS Noise Behavior of Junctionless Nanowires

Marcos Picoli, Renan Trevisoli, Rodrigo T. Doria

1-5
Graphene Trails on PECVD Hydrogenated Amorphous Silicon Carbide Films SiC-a: H by Laser Writing at Room Temperature

Deissy Johanna Feria, Marcelo Carreño, Ricardo Rangel, Ines Pereyra

1-4
Metallization of High Purity Al2O3 Substrate with Autocatalytic NiP Thin Films for Au Interconnections in MCM packaging technology.

Melissa Mederos Vidal, Alexander Flacker, Ricardo Cotrin Teixeira

1-4
Numerical Simulation of the Temperature on the Metallization of an Integrated Circuit and its Impact on Interconnect Lifetime

Rafael Oliveira Nunes, J. L. R. Bohorquez, R. L. de Orio

1-5
Organic Dielectric Films for Flexible Transistors as Gas Sensors

Dennis Cabrera García, José Enrique Eirez Izquierdo, Vinícius Augusto Machado Nogueira, José Diogo da Silva Oliveira, Marco Roberto Cavallari, Alain A. Quivy, Fernando Josepetti Fonseca

1-7
Performance and Analysis of n-Type Vertically Stacked Nanowires Regarding Harmonic Distortion

Cesar Augusto Belchior Carvalho, Genaro Mariniello da Silva, Bruna Cardoso Paz, Sylvain Barraud, Maud Vinet, Olivier Faynot, Marcelo Antonio Pavanello

1-5
Temperature, Silicon Thickness and Intrinsic Length Influence on the Operation of Lateral SOI PIN Photodiodes

Edson José Rodrigues, Michelly de Souza

1-5
The Correlation between the NBTI Effect and the Surface Potential and Density of Interface Traps in Junctionless Nanowire Transistors

Nilton Graziano Junior, Renan Trevisoli, Rodrigo T. Doria

1-5
Using the Hexagonal Layout Style for MOSFETs to Boost the Device Matching in Ionizing Radiation Environments

Vinicius Vono Peruzzi, William Cruz, Gabriel Augusto da Silva, Eddy Simoen, Cor Claeys, Salvador Pinillos Gimenez

1-5
UTBB Thermal Coupling Analysis in Technological Node Level

Fernando José Costa, Renan Trevisoli Doria, Rodrigo Trevisoli Doria

1-5
Validation of MEMS Based New MicroLPCVD Technique for Thin Films Deposition

Ricardo A.R. Oliveira, Marcelo N. P. Carreño, Inés Pereyra

1-5
Weak Presence of Women in Microelectronics: Analysis and Suggestions of the French Training Network to be More Attractive

Olivier André Bonnaud

1-5
Zero Temperature Coefficient behavior for Ellipsoidal MOSFET

Luciano Mendes Camillo, Marcos Paulo Braga de Lima, Marco Aurélio Pinhel Peixoto, Marcello Marcelino Correa, Salvador Pinillos Gimenez

1-5

Selected Papers from 19th Microelectronics Students Forum

Soft Error Impact on FinFET and CMOS XOR Logic Gates

Rafael N. M. Oliveira, Cristina Meinhardt

1-12